MIAYKE Koji's Homepage

• Precise control of normal load from nN to uN
• Indents can observe using AFM

　Figure shows the modulus of PS films evaluated using AFM indentation. Thickness of PS films were approximately 150 um (Thick film; △, □) and 55 nm (thin film; ▲, ■).
Pyramidal diamond tip (△, ▲) and spherical Rh-coated silicon nitride tip (□, ■) were used.

1. "Elastic Modulus of Polystyrene Film from Near-Surface to Bulk Measured by Nanoindentation Using Atomic Force Microscopy"
   K. Miyake, N. Satomi, and S. Sasaki
   Applied Physics Letters 89(3), 031925 (2006).
   
   
2. "The Effect of Pile-up and Contact Area on Hardness Test by Nanoindentation"
   K. Miyake, S. Fujisawa, A. Korenaga, T. Ishida, and S. Sasaki
   Japanese Journal of Applied Physics 43(7B), 4602-4605 (2004).
   
   
3. "ナノインデンテーション法による薄膜材料の機械的特性評価"
   "Evaluation of Mechanical Properties of Thin-film Materials Using Nanoindentation"
   三宅 晃司，佐々木信也
   Koji Miyake and Shinya Sasaki
   応用物理 79(4), 341-345 (2010).
   OYO BUTURI 79(4), 341-345 (2010). [in Japanese]
   
   
4. "ナノインデンテーション"
   "Nanoindentation"
   三宅晃司、元田智弘、佐々木信也
   Koji Miyake, Tomohiro Motoda, and Shinya Sasaki
   トライボロジスト 51(7), 518-523 (2006).
   Journal of Japanese Society of Tribologists 51(7), 518-523 (2006). [in Japanese]