Facilities for nanometronics

• Mechanical test facilities and analyzing tools (fatigue, tensile strength, X-CT, EBSD, FEM) for structural materials
• Mechanoluminescence for stress and fracture imaging
• AFM probe for mechanical properties and molecular bonding
• Moiré method for nano-deformation
• CRAVITY (Clean Room for Analog-digital superconductiVITY) for unconventional superconducting measuring devices that enables fluorescence-yield X-ray absorption Fine Structure (XAFS) for diluted light elements in collaboration with KEK PF, and particle induced X-ray emission (PIXE) for light elemental mapping with ion microbeam in University of Tsukuba.
• Positron probe micro analyzer for atomic scale lattice defect and nano-void imaging
• Electron Linear Accelerator (LINAC) for positrons and neutrons