Microtribology

Background and Objective of Research

Many studies on the manufacture of micro machines and MEMS (micro electromechanical systems) have been conducted recently . For micro machines, as the dimensions of components decrease, the surface area decreases in proportion to the square of the linear decrease while the volume decreases in proportion to the cube power of the linear decrease (Fig. 1). Therefore, the influence of the surface force increases dramatically, and the tribological characteristics become more important.
We do research on microtribology in order to clarify the tribological characteristics under an extremely low normal load where the effect of the adhesion forces is not negligible, and to develop suitable lubrication methods for micromachine.

 


Fig. 1 Relation between surface area and volume when dimensions decrease

 

Research Topics

Relation between adhesion force and friction force

Fig. 2 shows the friction force and the pull-off force between a copper test piece and a silicon plate, which were measured under constant normal load. the pull-off force is the average measured before and after each friction force measurement. The friction force is about 30 mN even when the applied normal load is zero.
The data in Fig. 2 are arranged in Fig. 3. In this figure, (light blue) shows the friction coefficient calculated from only the normal load, while (red) shows the friction coefficient calculated from the friction force divided by the sum of the normal load and the pull-off force. In Fig. 3, assuming that the pull-off force acts as a type of normal load, the friction coefficients become constant. This indicates that the adhesion force as same as the mean pull-off force measured before and after friction also acts during friction and influences the friction force just as the normal load does.

Fig. 2 Friction force and pull-off force versus normal load
Fig. 3 Relation between friction coefficient between normal load (+pull-off force)

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Related papers

 

Lubrication method by decreasing adhesion force

When the applied normal load is very low as found in MEMS, the friction force can be reduced by reducing the adhesion force. The adhesion force caused by the Van der Waals force and surface tension of adsorbed water is greatly affected by contact area. Some studies reported that slight roughness decreases the adhesion force significantly. Therefore, creating asperity is considered to be an effective way to reduce the adhesion and friction forces.
We examined the adhesion (pull-off) and friction forces on silicon surfaces having periodic asperity (two-dimensional array of mounds) First, we used a focused ion beam (FIB) to create two-dimensional asperity arrays as shown in Fig. 4 by milling grooves in two orthogonal directions. We then used an atomic force microscope (AFM) to measure these forces between the silicon surface and the flat AFM probe. Figure 5 shows the relation among the friction and pull-off forces and groove depth. The friction and pull-off forces are proportional to the radius of curvature of asperity peak.

Fig. 4 AFM images of silicon surfaces having cyclic grooves
Fig. 5 Relation between friction and pull-off forces and curvature radii

Related papers

 

Wear Tests and Pull-off Force Measurements of Single Asperities

At the micro-scale level, the adhesion force dominates the friction force when the normal load approaches zero. For determining the effects of micro wear on the adhesion (pull-off) force, the wear-induced changes in surface topography of asperities and the pull-off force between the asperities and leaf springs were determined. First, single asperities were formed on a single-crystal gold plate and the asperities were rubbed with a silicon leaf spring attached to an AFM. A focused ion beam (FIB) system was used to form gold pyramid-shaped asperities on the surface of a single crystal gold plate. The FIB was also used to create the single crystal silicon parallel leaf spring. The pull-off force increased monotonically with sliding distance, showing a more rapid increase at the higher normal load. The worn area of the asperity peak (measured by using an ordinary AFM probe) was proportional to the pull-off force.

 
Fig. 6 Au asperity processed by FIB
Fig. 7 Micro parallel leaf spring

Related papers

->Microdevices for micro/nano science

 

 

 

last update October.10. 2001

Index of Projects

Primal Scientist: Yasuhisa ANDO