RESEARCH FACILITIES (Home) (ホーム)
* IR-Extended Near Infrared Photoluminescence Mapping System (up to 2.3micron) : Unprecedented and very useful for carbon nanotube research
* UV-Vis-NIR Spectrophotometer
* Spectrofluorometer
* Si-CCD Camera system (for UV-Vis-NIR Multi-channel Light Detection)
* InGaAs Photodiode Array System (for luminescence measurement of single-wall carbon nanotubes)
* Raman Spectrometer (Micro and Macro) with a Liq N2 Cryostat
* UV-Vis-NIR Constant Photon Flux Spectral Irradiation System
* UV-Vis-NIR Multi-channel Spectral Light Detection System Based on Si-Photodiode Array
* UV-Vis-NIR Spectral Light Detection System (single-channel)
* NIR to mid-IR Light Detection System Based on FT-IR
* Streak Camera System for Luminescence Decay Measurements
(Hamamatsu, Time Resolution: 5 ps)
* Time of Flight Transient Photoconductivity Measurement System
(for Carrier Mobility Measurement)
* STM/AFM System to Probe Nano-scale Optoelectronic Properties
* UHV Chamber with an Adapted Cryostat (20-473K) for Molecular Beam Deposition and in situ Optical/Electrical Measurements
* 3 Optical Cryostats (20-473K, 10-473K, 1.6-500K, 77K-RT)
* 2 Vacuum Vapor Deposition Apparatuses (for metals and organic substances)
* Ultra-Centrifuge 200,000G Max (for purification/separation of carbon nanotubes)
* 80 fs Ti: Sapphire Laser (Spectra-Physics) + SH/TH
* CW Ti:Sapphire Laser (700-1000nm) excited with Millenia (Spectra-Physics)
* 300 ps N2/dye Laser System
* 10 ns YAG Laser + SH/TH/FH + OPO System
* CW Ar Ion Laser
* CW He-Cd Laser
* CW He-Ne Laser
* CW Semiconductor Laser (662nm, 785nm, 1300nm)* Other Standard Electrical Measurement Instruments
(Semiconductor Parameter Analyzer, Oscilloscope, Lock-in Amplifier, Electrometer, AC/DC Power Supply etc.)
In addition, AIST has a number of advanced analytical instruments available for shared use such as FT-IR, XRD, NMR, ESR, SEM, TEM, XPS, UPS, etc.
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